EMAG 2018: Applications of Electron Microscopy to Beam Sensitive Materials

Jul 4 2018

University of Warwick, Coventry, CV4 7AL, UK
Wed, 4 Jul – Fri, 6 Jul 2018

EMAG is one of the longest running electron microscopy conferences in the UK and attracts international speakers as well as a large part of the UK microscopy community. The conference will focus on Applications of Electron Microscopy to Beam Sensitive Materials.

Event Title: EMAG 2018: Applications of Electron Microscopy to Beam Sensitive Materials
Organised by: IOP Electron Microscopy and Analysis Group
Requires registration: Yes
Contact details: Jon Roe, Tel: +44 (0)20 7470 4800, Email: jon.roe@iop.org